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GaAlN/GaN HEMT heterostructures grown on ‘SiCopSiC' composite substrates for HEMT application

Authors: Di Forte-Poisson, M.A.; Sarazin, N.; Magis, M.; Tordjman, M.; Di Persio, J.; Langer, R.; Guziewicz, M.; +6 Authors

GaAlN/GaN HEMT heterostructures grown on ‘SiCopSiC' composite substrates for HEMT application

Abstract

In this paper, we report on an innovative solution based on "composite substrates". The GaAlN/GaN HEMT structures are grown on SiCopSiC composite substrates made of thin single crystal SiC “seed layer” transferred on top of a thick polycrystalline SiC, following the "Smart Cut" technology developed by SOITEC. Thanks to the physical properties of the high quality single crystal SiC combined with the high thermal conductivity of the inexpensive polycrystalline SiC, the SiCopSiC composite substrates are expected to significantly improve the cost of the GaAlN/GaN HEMT structures grown on it, while keeping similar device performances compared to GaAlN/GaN structures grown on bulk SiC substrates.

Countries
Italy, France
Keywords

Gallium Nitride; HEMT; Composite Substrate; smart-cut

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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
0
Average
Average
Average
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