Modeling leaf appearance rate for Canada Western Red Spring wheat cultivars

descriptionPublicationkeyboard_double_arrow_right Article 01 Jul 2010 English Publisher:Canadian Science PublishingJournal:Canadian Journal of Plant Science, volume 90, pages 399-402 (issn: 0008-4220, eissn: 1918-1833,

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Authors: H. Wang; H. Cutforth; R M DePauw; T. McCaig; G. McLeod; K. Brandt; X. Qin;

doi: 10.4141/cjps09151

Modeling leaf appearance rate for Canada Western Red Spring wheat cultivars

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Abstract

The rate of leaf appearance [LAR (d-1)] was observed for two older (Marquis and Neepawa) and two newer (AC Barrie and AC Elsa) Canada Western Red Spring (CWRS) wheat (Triticum aestivum L.) cultivars grown in a semiarid environment on the Canadian prairies for four years. Although the newer cultivars significantly increased yield LAR did not change when compared with the older cultivars. A simulation model developed by Jame et al. (1998a), and using coefficients for Neepawa determined from a previous study adequately predicted LAR for all four cultivars.Key words: Wheat, leaf appearance rate, temperature, daylength, model

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