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Optical Arbitrary Waveform Measurement Using Silicon Photonic Slicing Filters

descriptionPublicationkeyboard_double_arrow_right Article 15 Mar 2022 Germany Publisher:Institute of Electrical and Electronics Engineers (IEEE)Journal:Journal of Lightwave Technology, volume 40, pages 1,705-1,717 (issn: 0733-8724, eissn: 1558-2213,

Authors: Dengyang Fang; Andrea Zazzi; Juliana Muller; Daniel Drayss; Christoph Fullner; Pablo Marin-Palomo; Alireza Tabatabaei Mashayekh; +8 Authors

doi: 10.1109/jlt.2021.3130764

Optical Arbitrary Waveform Measurement Using Silicon Photonic Slicing Filters

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Country

Germany

Related Organizations

RWTH Aachen University
Germany
Karlsruhe Institute of Technology
Germany
University of Paderborn
Germany

Keywords

ddc:620, Engineering & allied operations, info:eu-repo/classification/ddc/620, 620

Impact byBIP!

	citations This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).	8
	popularity This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.	Top 10%
	influence This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).	Average
	impulse This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.	Top 10%

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Top 10%

Average

Top 10%

hybrid

Fields of Science

engineering and technology

electrical engineering, electronic engineering, information engineering

Fields of Science

engineering and technology

electrical engineering, electronic engineering, information engineering

Funded by

EC| TeraSlice, EC| MICROCOMB, EC| TeraSHAPE