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Publication . Article . 2022
Optical Arbitrary Waveform Measurement (OAWM) Using Silicon Photonic Slicing Filters
Dengyang Fang; Andrea Zazzi; Juliana Mueller; Daniel Dray; Christoph Füllner; Pablo Marin-Palomo; Alireza T. Mashayekh; +8 Authors
Dengyang Fang; Andrea Zazzi; Juliana Mueller; Daniel Dray; Christoph Füllner; Pablo Marin-Palomo; Alireza T. Mashayekh; Arka Dipta Das; Maxim Weizel; Sergiy Gudyriev; Wolfgang Freude; Sebastian Randel; J. Christoph Scheytt; Jeremy Witzens; Christian Koos;
Closed Access
15 Mar 2022 Journal of Lightwave Technology, volume 40, pages 1,705-1,717 (issn: 0733-8724, eissn: 1558-2213, 
Copyright policy )
Copyright policy ) Institute of Electrical and Electronics Engineers (IEEE)
Microsoft Academic Graph classification: Optoelectronics business.industry business Silicon photonics Waveform Slicing Materials science
Atomic and Molecular Physics, and Optics
Atomic and Molecular Physics, and Optics
Microsoft Academic Graph classification: Optoelectronics business.industry business Silicon photonics Waveform Slicing Materials science
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