Thin-film organic field-effect transistor was made with vapor-deposited polycrystalline octithiophene on silicon oxide insulator layers. In conventional field-effect transistors, the extracted mobility does not take into account the distribution of charge carriers. However, in disordered organic field-effect transistors, the local charge carrier mobility decreases from the semiconductors/insulator interface in to the bulk, due to its dependence on the charge carrier density. It is demonstrated that the conventional field-effect mobility is a good approximation for the local mobility of the charge carriers at the interface. In this paper we present a new approach to the mobility in organic thin-film transistor (OTFTs), and with a new procedure we extract the electrical parameters of organic TFTs that possible to reproduce very well the device characteristic and mobility.