
pmid: 26542747
Transistor parameter extraction by the conventional transconductance method can lead to a mobility overestimate. Organic transistors undergoing major contact resistance experience a significant drop in mobility upon mild annealing. Before annealing, strong field-dependent contact resistance yields nonlinear transfer curves with locally high transconductances, resulting in a mobility overestimate. After annealing, a contact resistance below 200 Ω cm is achieved, which is stable over a wide V(G) range.
Technology, Chemistry, Multidisciplinary, contact resistance, Materials Science, Materials Science, Multidisciplinary, SEMICONDUCTOR, 09 Engineering, Physics, Applied, THICKNESS, Nanoscience & Nanotechnology, carrier mobility, 40 Engineering, Science & Technology, 02 Physical Sciences, CONTACT RESISTANCE, Chemistry, Physical, Physics, organic transistors, 34 Chemical sciences, Chemistry, Physics, Condensed Matter, Physical Sciences, Science & Technology - Other Topics, THIN-FILM TRANSISTORS, field-effect mobility, INJECTION, 51 Physical sciences, 03 Chemical Sciences
Technology, Chemistry, Multidisciplinary, contact resistance, Materials Science, Materials Science, Multidisciplinary, SEMICONDUCTOR, 09 Engineering, Physics, Applied, THICKNESS, Nanoscience & Nanotechnology, carrier mobility, 40 Engineering, Science & Technology, 02 Physical Sciences, CONTACT RESISTANCE, Chemistry, Physical, Physics, organic transistors, 34 Chemical sciences, Chemistry, Physics, Condensed Matter, Physical Sciences, Science & Technology - Other Topics, THIN-FILM TRANSISTORS, field-effect mobility, INJECTION, 51 Physical sciences, 03 Chemical Sciences
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