A fast collocation method for an inverse boundary value problem
Copyright policy )A fast collocation method for an inverse boundary value problem
AbstractIn this paper, we present an implementation of a fast multiscale collocation method for boundary integral equations of the second kind, and its application to solving an inverse boundary value problem of recovering a coefficient function from a boundary measurement. We illustrate by numerical examples the insensitive nature of the map from the coefficient to measurement, and design and test a Gauss–Newton iteration algorithm for obtaining the best estimate of the unknown coefficient from the given measurement based on a least‐squares formulation. Copyright © 2004 John Wiley & Sons, Ltd.
- West Virginia University United States
- Wright State University United States
- West Virginia University Institute of Technology United States
- University System of Ohio United States
Inverse boundary value problem, Inverse problems for PDEs, Statistical mechanics of semiconductors, numerical examples, Laplace operator, Helmholtz equation (reduced wave equation), Poisson equation, Numerical methods for inverse problems for boundary value problems involving PDEs, Boundary element methods for boundary value problems involving PDEs, Laplace equation, Multiscale method, Gauss-Newton iteration algorithm, multiscale method, semiconductor contact resistance, boundary integral equations, inverse boundary value problem, Collocation method, Semiconductor contact resistance
Inverse boundary value problem, Inverse problems for PDEs, Statistical mechanics of semiconductors, numerical examples, Laplace operator, Helmholtz equation (reduced wave equation), Poisson equation, Numerical methods for inverse problems for boundary value problems involving PDEs, Boundary element methods for boundary value problems involving PDEs, Laplace equation, Multiscale method, Gauss-Newton iteration algorithm, multiscale method, semiconductor contact resistance, boundary integral equations, inverse boundary value problem, Collocation method, Semiconductor contact resistance
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