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This research is funded by the EMPIR 17IND05 MicroProbes and 19ENG05 NanoWires projects. The projects 17IND05 MicroProbes and 19ENG05 NanoWires have received funding from the EMPIR program co-financed by the Participating States and from the European Union's Horizon 2020 research and innovation program.
Raw data and figures used for the article "Damped Cantilever Microprobes for High-Speed Contact Metrology with 3D Surface Topography", published in Sensors 2023, 23(4), 2003.
tactile surface scanning, high-throughput metrology, piezoresistive cantilever, resonance frequency, quality factor, contact mode
tactile surface scanning, high-throughput metrology, piezoresistive cantilever, resonance frequency, quality factor, contact mode
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