Downloads provided by UsageCounts
A semiconductor switch is employed in Component A generator instead of conventional mechanical switch in aircraft lightning actual transient test. One order of magnitude noise reduction is observed in open circuit voltage responses. Causes of the noises are discussed. Electro-magnetic (EM) shielding at both ends of cables under test becomes unnecessary in most cases for Component A measurements with introduction of the semiconductor switch. Simple shielding for Component H measurements is developed considering frequency range and levels of noises associated with the Component H responses. The semiconductor switch of the generator shows durability through three thousand shots of operation.
| selected citations These citations are derived from selected sources. This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | 0 | |
| popularity This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network. | Average | |
| influence This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | Average | |
| impulse This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network. | Average |
| views | 4 | |
| downloads | 12 |

Views provided by UsageCounts
Downloads provided by UsageCounts