
This package contains raw dataset that supports the article entitled: AstroECP: towards more practical electron channeling contrast imaging M. Haroon Qaisera, Lukas Bernersb, Robin J. Scalesc, Tianbi Zhanga, Martin Hellerb, Jiří Dluhošd, Sandra Korte-Kerzelb and T. Ben Brittona*a Department of Materials Engineering, University of British Columbia, Vancouver, BC Canada Mb Institute of Physical Metallurgy and Materials Physics, RWTH Aachen University, Germany c Department of Materials, University of Oxford, Oxford, Oxfordshire, United Kingdom d TESCAN Group a.s., Libušina třída 21, Brno, Czech Republic * Correspondence email: ben.britton@ubc.ca J. Appl. Cryst. 59 (2026): https://doi.org/10.1107/S1600576726000567 Pre-print (arXiv): https://arxiv.org/pdf/2507.00354 ----------------- The folders in this dataset contain selected area electron channeling patterns (SA-ECP), micrographs and EBSD data acquired using TESCAN AMBER-X plasma-FIB field-emission scanning electron microscope (pFIB-FESEM). The dynamical reference spherical patterns of Si and GaAs were acquired using EMsoft v5.0 (Singh et al., 2017). Singular projections with very high angular resolution ECPs were also generated using a Bloch Wave Kikuchi Diffraction (BWKD) approach (Winkelmann et al., 2021). Folders: High resolution dynamical reference patterns of Si and GaAs: \Dynamical_patterns SA-ECP of silicon used in Fig.1 \Fig1_SAECP.zip Simulated ECPs of Si using BWKD and EMsoft \Fig2_beam_energy_simulation.zip SA-ECPs of Si acquired at different beam currents (keeping same electron dose) \Fig3_beam_current.zip SA-ECPs of Si for determining WD vs DD relationship and optic axis \Fig4_WD_vs_DD.zip Tilt-X, Tilt-Y and Rotation series of ECPs \Fig5_Fig9_stage_calibration_and_precession.zip EBSD data and SA-ECPs used in Fig.7 \Fig7_EBSD_and_SAECP.zip Raw pyChord data \Fig9_Fig10_pyChord.zip Raw micrographs featuring dislocations \Fig11_ECCI_micrographs.zip The MATLAB scripts including AstroECP v1 are available on GitHub as part of AstroEBSD (https://github.com/ExpMicroMech/AstroEBSD/tree/main/modules/AstroECP). ----------------- The authors thank a range of funders that supported this collaborative work: Natural Sciences and Engineering Research Council of Canada (NSERC) [Discovery grant: RGPIN 2022-04762, ‘Advances in Data Driven Quantitative Materials Characterisation’]; British Columbia Knowledge Fund (BCKDF) Canada Foundation for Innovation – Innovation Fund (CFI-IF) [#39798, ‘AM+’] and [#43737, 3D MARVIN]; PEEF 2023 supporting H. Qaiser; the MITACS Globallink Research Award (# IT37646 and #IT28799); the German research foundation (DFG) within the Collaborative Research Centre SFB 1394 “Structural and Chemical Atomic Complexity—From Defect Phase Diagrams to Materials Properties” (Project ID 409476157) including the project group C02.
Electron channeling contrast imaging, Dislocations, AstroECP, ECP, Electron Channeling Pattern, ECCI
Electron channeling contrast imaging, Dislocations, AstroECP, ECP, Electron Channeling Pattern, ECCI
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