Test results for transient excitation boosting at Grand Coulee

descriptionPublicationkeyboard_double_arrow_right Article 01 Jan 1991Publisher:Institute of Electrical and Electronics Engineers (IEEE)Journal:IEEE Transactions on Energy Conversion, volume 6, pages 367-372 (issn: 0885-8969,

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Authors: Lennon, C. A.;

doi: 10.1109/60.84308

Test results for transient excitation boosting at Grand Coulee

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Abstract

Transient excitation boosting (TEB) hardware is discussed, and its design and installation are described. The test results from the hardware commissioning on each generator type are addressed. The results show that an 8% boost in terminal voltage results in about a 50% change in reactive power loading and about a 10% change in real power with the classical high-frequency damped oscillations which are typical of a step response. >

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