A time-of-flight backscattering spectrometer at the Spallation Neutron Source, BASIS

descriptionPublicationkeyboard_double_arrow_right Article 01 Aug 2011 English Publisher:AIP PublishingJournal:Review of Scientific Instruments, volume 82 (issn: 0034-6748, eissn: 1089-7623,

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Authors: Mamontov, E.; Herwig, K. W.;

doi: 10.1063/1.3626214

pmid: 21895277

A time-of-flight backscattering spectrometer at the Spallation Neutron Source, BASIS

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Abstract

We describe the design and current performance of the backscattering silicon spectrometer (BASIS), a time-of-flight backscattering spectrometer built at the spallation neutron source (SNS) of the Oak Ridge National Laboratory (ORNL). BASIS is the first silicon-based backscattering spectrometer installed at a spallation neutron source. In addition to high intensity, it offers a high-energy resolution of about 3.5 μeV and a large and variable energy transfer range. These ensure an excellent overlap with the dynamic ranges accessible at other inelastic spectrometers at the SNS.

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Oak Ridge National Laboratory
United States

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