
handle: 11424/226628
PIXE-Particle Induced X-Ray Emission is a multielemental, sensitive and non-destructive method which has been in use in trace elemental analysis since 1970. This review aims to explain the main features of PIXE. References will be given at the end for those that seek more detailed knowledge on the principles and applications of this technique.
TRACE-ELEMENT ANALYSIS, elemental analysis, K-SHELL, particle induced X-ray emission, trace element, HEAVY CHARGED-PARTICLES, ion induced X-ray, SHELL COULOMB IONIZATION, CROSS-SECTIONS
TRACE-ELEMENT ANALYSIS, elemental analysis, K-SHELL, particle induced X-ray emission, trace element, HEAVY CHARGED-PARTICLES, ion induced X-ray, SHELL COULOMB IONIZATION, CROSS-SECTIONS
| selected citations These citations are derived from selected sources. This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | 0 | |
| popularity This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network. | Average | |
| influence This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | Average | |
| impulse This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network. | Average |
