Temperature measurement on series resistance and devices in power packs based on on-state voltage drop monitoring at high current

descriptionPublicationkeyboard_double_arrow_right Article 01 Sep 2006 Spain English Publisher:Elsevier BVJournal:Microelectronics Reliability, volume 46, pages 1,834-1,839 (issn: 0026-2714,

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Authors: X. Perpiñà; Jean-François Serviere; J. Saiz; Davide Barlini; Michel Mermet-Guyennet; José Millán;

doi: 10.1016/j.microrel.2006.07.078

handle: 10261/43236

Temperature measurement on series resistance and devices in power packs based on on-state voltage drop monitoring at high current

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Abstract

6 páginas, 6 figuras.-- Trabajo presentado al 17th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis celebrado en Wuppertal (Alemania) del 3 al 6 de octubre de 2006.-- et al. Based on the on-state voltage drop monitoring at high current, an alternative method for thermo-sensitive parameters calibration is reported. The main goal is that it allows the simultaneous calibration of the series resistance and power devices voltage drop on temperature. Thereby, the average temperature over all power devices and the temperature difference in average inside the pack can be measured in real applications. This work has been carried out in the framework of the European project PORTES (MTKI-CT-2004- 517224). Peer reviewed

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Spain

Related Organizations

Integrated Systems Laboratory
Switzerland
Spanish National Research Council
Spain
École Polytechnique Fédérale de Lausanne EPFL
Switzerland
Alstom (France)
France

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