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DIGITAL.CSIC
Article . 2010 . Peer-reviewed
Data sources: DIGITAL.CSIC
EPL (Europhysics Letters)
Article . 2002 . Peer-reviewed
Data sources: Crossref
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Grazing-incidence diffraction anomalous fine structure of InAs/InP(001) self-assembled quantum wires

Authors: Grenier, S.; Proietti, M. G.; Renevier, H.; González Sotos, Luisa; García Martínez, Jorge Manuel; García, Joaquín;

Grazing-incidence diffraction anomalous fine structure of InAs/InP(001) self-assembled quantum wires

Abstract

We have studied nanostructured samples of InAs/InP(001) by means of Grazing Incidence Diffraction Anomalous Fine Structure. The samples, grown by molecular beam epitaxy, show a periodic corrugation on the surface giving rise to an array of self-assembled quantum wires after deposition of 2.5 monolayers of InAs. We measured the (440) and (420) GIDAFS spectra, at the As K-edge, at incidence and outgoing angles close to the substrate's critical angle. We analysed the anomalous diffraction lineshapes vs. the energy, as well as the oscillatory part of the signal in the extended region above the edge and obtained, for the first time, information about composition and strain inside the quantum wires and close to the interface. Our results suggest possible interfaces.

We acknowledge the French CRG-BM02 (D2AM) and the Italian CRG-BM08 (GILDA) beamlines for granting beam time and for technical assistance. We are grateful to Drs. F. D’Acapito and A. Mazuelas for helpful discussions. One of the authors (MGP) is pleased to acknowledge support from the “Université Joseph Fourier” of Grenoble and the “Centre National pour la Recherche Scientifique” for visits during which the research was completed. This work was also supported by the LEA-MANES European Agreement and by CICYT project No. MAT99-0847.

7 páginas, 5 figuras, 1 tabla.-- PACS: 61.10.-i – X-ray diffraction and scattering. 61.10.Ht – X-ray absorption spectroscopy: EXAFS, NEXAFS, XANES, etc. 68.65.-k – Low-dimensional, mesoscopic, and nanoscale systems: structure and nonelectronic properties.

Peer reviewed

Country
Spain
Keywords

Surfaces, Nanoscale, Thin films, Interfaces, Low-D systems

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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
views
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