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handle: 11441/136095 , 10261/194101
High temperature compressive creep of SiC-HfB2 UHTCs up to 2000 °C has been studied. Microstructural analysis after deformation reveals formation of new phases in the Hf-B-Si and Hf-B-Si-C systems, which are responsible for the poor creep resistance. RE oxide additions have a negative effect reducing the creep resistance of SiC-HfB2 UHTCs. A simplistic analysis for the required creep resistance is described, indicating that only SiC-HfB2 UHTCs could withstand re-entry conditions for 5 min in a single use. However, RE oxide addition to SiC-HfB2 UHTCs does not provide the required creep resistance for them to be candidate materials for hypersonic applications.
EPSRC grant XMAT (EP/K008749/1)
MINECO AT2015-71411-R
Cavitation damage, Limited ductility, Ultra-high temperature ceramics, Reaction damage, Creep
Cavitation damage, Limited ductility, Ultra-high temperature ceramics, Reaction damage, Creep
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