Mapping stress in polycrystals with sub-10 nm spatial resolution

descriptionPublicationkeyboard_double_arrow_right Article 01 Jan 2017 English Publisher:Royal Society of Chemistry (RSC)Journal:Nanoscale, volume 9, pages 13,938-13,946 (issn: 2040-3364, eissn: 2040-3372,

Copyright policy )Funded by:EC | 3DNANOMECH

Authors: C. Polop; E. Vasco; A. P. Perrino; R. Garcia;

doi: 10.1039/c7nr00800g

pmid: 28686260

handle: 10261/188895

Mapping stress in polycrystals with sub-10 nm spatial resolution

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Abstract

From aircraft to electronic devices, and even in Formula One cars, stress is the main cause of degraded material performance and mechanical failure in applications incorporating thin films and coatings.

Related Organizations

Spanish National Research Council
Spain
Autonomous University of Madrid
Spain
Instituto de Ciencia de Materiales de Madrid
Spain

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