Observation of Doubly Charged Tellurium Cluster Ions at Small Size Range Using a Secondary Ion Mass Spectrometry.

descriptionPublicationkeyboard_double_arrow_right Article 01 Jan 1998Publisher:The Mass Spectrometry Society of JapanJournal:Journal of the Mass Spectrometry Society of Japan, volume 46, pages 433-436 (issn: 1340-8097, eissn: 1880-4225,

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Authors: SATOH, Takaya; ITO, Hiroyuki; ICHIHARA, Toshio; KATAKUSE, Itsuo; MATSUO, Takekiyo;

doi: 10.5702/massspec.46.433

Observation of Doubly Charged Tellurium Cluster Ions at Small Size Range Using a Secondary Ion Mass Spectrometry.

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Abstract

Mass spectra of doubly charged tellurium clusters were investigated by a secondary ion mass spectrometry. Cluster ions were produced by the Xe ions bombardment on the tellurium sheet and were mass-analyzed using a grand-scale sector type mass spectrometer. Te22+, Te32+, and Te52+ were observed.

Related Organizations

Osaka University
Japan

Keywords

Doubly charged cluster ion, Tellurium cluster ion, Initial kinetic energy, Double focusing sector type mass spectrometer, Secondary ion mass spectrometry (SIMS)

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