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The optimum thickness of a silicon solar cell base is determined using phenomelogic parameters, which are the minority carriers diffusion coefficient and the recombination velocity at the back side, influenced by Lorentzs law and the Umklapp process.The results obtained are consistent with the generation of minority charge carriers deep in the base by a monochromatic light of long wavelength.
Silicon Solar Cell Diffusion Coefficient Absorption coefficient Surface Recombination Velocity Optimum Base Thickness Lorentz and Umklapp Processes
Silicon Solar Cell Diffusion Coefficient Absorption coefficient Surface Recombination Velocity Optimum Base Thickness Lorentz and Umklapp Processes
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