Neutron activation analysis was used as a nondestructive technique to positively distinguish between cusil (28% Cu, 72% Ag) and silver braze material bonding electrical leads to the substrate of an LSI. The SLL californium-252 source was used to activate LSI samples and a small volume Ge(Li) spectrometer was used to observe the characteristic radiations. Based on these results, it is concluded that an exposure of the braze material for twenty-four hours to a thermal neutron flux of 10 7