
doi: 10.1626/pps.1.254
The rate of leaf development in wheat is related to time and temperature in units of degree-days (DD) leaf−1 (phyllochron). Experiments were conducted in controlled environment chambers to study the effect of day to night variation in temperature on leaf development in two wheat cultivars, Penawawa and Stephens. Plants were grown at constant 20°C, and in eight day/night temperature ranges as wide as 8/32°C to 32/8°C, all with a mean temperature of 20°C. The leaf number on the main stems was counted (in Haun units) every other day, from the emergence of the 2nd leaf until the emergence of the 5th leaf. Leaf phyllochron values were derived from the inverse of the slopes of the linear regression of leaf number on DD. Phyllochron values ranged from 99 to 153 DD leaf−1. The phyllochron values were greater when higher temperatures were imposed at night under extreme day to night temperature treatment.
Leaf, Wheat, Temperature, Plant culture, Development, Phyllochron, SB1-1110
Leaf, Wheat, Temperature, Plant culture, Development, Phyllochron, SB1-1110
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