Summary: A generalization of the log-logistic distribution, called exponentiated log-logistic distribution [in lines of the exponentiated Weibull distribution suggested by \textit{G. S. Mudholkar} et al., Technometrics 37, No. 4, 436--445 (1995)] is considered. The operating characteristic for a sampling plan is determined for the case that a lot of products is submitted for inspection with lifetimes specified by an exponentiated log-logistic distribution (ELLD). The results are illustrated by a numerical example.