
doi: 10.1364/oe.17.024261
pmid: 20052137
LN photonic wires of cross-section dimensions down to 1 x 0.73 microm2 were fabricated by Ar milling of a single-crystalline LiNbO3 (LN) film bonded to a SiO2/LiNbO3 substrate. Mode intensity distributions, propagation losses, and group indices of refraction were measured at 1.55 microm wavelength and compared with simulation results. Moreover, effective mode indices and end face reflectivities were numerically evaluated. The waveguide of 1 microm top width is the smallest LN photonic wire reported to date; it has a mode size of approximately 0.4 microm2 (0.5 microm2) only and propagation losses of 9.9 dB/cm (12.9 dB/cm) for qTM (qTE) polarization.
Photons, Niobium, Optical Devices, Oxides, Equipment Design, Nanostructures, Equipment Failure Analysis, Refractometry, Materials Testing, Computer-Aided Design, Scattering, Radiation
Photons, Niobium, Optical Devices, Oxides, Equipment Design, Nanostructures, Equipment Failure Analysis, Refractometry, Materials Testing, Computer-Aided Design, Scattering, Radiation
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