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Backscattered and Secondary-Electron Emission

Authors: Ludwig Reimer;

Backscattered and Secondary-Electron Emission

Abstract

The backscattering coefficient η and the secondary-electron yield δ depend on electron energy E, atomic number Z, and surface tilt angle ϕ, and show characteristic energy and angular distributions that are important to the discussion of the image formation when using the signal of backscattered and secondary electrons.

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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
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