Overview of Reliability Testing

descriptionPublicationkeyboard_double_arrow_right Article 01 Jun 2012Publisher:Institute of Electrical and Electronics Engineers (IEEE)Journal:IEEE Transactions on Reliability, volume 61, pages 282-291 (issn: 0018-9529, eissn: 1558-1721,

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Authors: Elsayed A. Elsayed;

doi: 10.1109/tr.2012.2194190

Overview of Reliability Testing

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Abstract

This paper presents an overview of reliability testing, reliability estimation, and prediction models. It also presents approaches for the design of test plans which result in providing failure data and/or degradation data in a limited test duration. Equivalence of different test plans which result in similar reliability estimates is also discussed. Use of degradation data for reliability estimates and maintenance decisions are presented.

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Rutgers, The State University of New Jersey
United States

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