Manipulation of Magnetic Domain Structures With Helical Magnetization in Magnetic Microwires

descriptionPublicationkeyboard_double_arrow_right Article 01 Nov 2014Publisher:Institute of Electrical and Electronics Engineers (IEEE)Journal:IEEE Transactions on Magnetics, volume 50, pages 1-3 (issn: 0018-9464, eissn: 1941-0069,

Copyright policy )

Authors: Alexander Chizhik; Andrzej Stupakiewicz; Arcady P. Zhukov; Andrzej Maziewski; Julian Gonzalez; Vitalii Zablotskii;

doi: 10.1109/tmag.2014.2328662

Manipulation of Magnetic Domain Structures With Helical Magnetization in Magnetic Microwires

- Summary
- Metrics

Abstract

We report investigations on crossed magnetic field-induced transformation of surface domain structure in amorphous glass covered microwires. The study has been performed by a magneto-optical Kerr effect technique using optical microscopy. The existence of elliptic domain structure has been demonstrated experimentally. The formation of the domain structure with periodically inclined domain walls caused by the circular magnetic field was found in the surface of microwires.

Related Organizations

Ikerbasque
Spain
Czech Academy of Sciences
Czech Republic
University of Białystok
Poland
University of the Basque Country
Spain

Impact byBIP!

	selected citations These citations are derived from selected sources. This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).	4
	popularity This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.	Average
	influence This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).	Average
	impulse This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.	Average