Charge yield and total ionizing dose measurements

descriptionPublicationkeyboard_double_arrow_right Article 01 Sep 2007Publisher:IEEEJournal:2007 9th European Conference on Radiation and Its Effects on Components and Systems

Authors: Avner Haran; Michael Murat; Joseph Barak; David David;

doi: 10.1109/radecs.2007.5205537

Charge yield and total ionizing dose measurements

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Abstract

An experimental study of charge-yield of gamma and alpha radiation sources is presented. Monte-Carlo simulation is applied to explain the experimental results. Important implications of charge-yield to TID measurements using MOSFET dosimeters in space and other high energy particle environments are discussed.

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SOREQ NUCLEAR RESEARCH CENTER
Israel

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