An improved CMOS BICS for on-line testing

descriptionPublicationkeyboard_double_arrow_right Article , Conference object 07 Nov 2002Publisher:IEEE Comput. SocJournal:Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646)

Authors: Yvan Maidon; Yann Deval; Jean-Baptiste Bégueret;

doi: 10.1109/olt.2000.856620

An improved CMOS BICS for on-line testing

- Summary
- Metrics

Abstract

Dedicated to a wide range of power supplies current monitoring, a new version of a CMOS built-in current sensor is proposed. It takes advantage of the classical parasitic resistor attached to an interconnection layer, as well as to a feedback circuit with high static gain capability. Analysis and simulation reveal that the transducer is accurate, linear and transparent. Process dependencies are taken into account. The sensor was designed in a 0.6 /spl mu/m technology and its simulated characteristics are reported in this paper.

Related Organizations

University of Bordeaux
France

Impact byBIP!

	selected citations These citations are derived from selected sources. This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).	2
	popularity This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.	Average
	influence This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).	Average
	impulse This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.	Average