As modern electronics becomes more complex and greater use is made of microminiature techniques in order to compress more functions into every pound of electronic hardware, the electronic designer is faced with many new problems. In addition to the inevitable interconnections and packaging problems, he is requested to insure greater reliability, greater accuracy of response and greater performance under more severe environmental conditions than has ever been imposed before. In addition to the usual altitude, temperature, shock and low energy electrical interference criteria, new criteria show increased tendency to require the electronics to withstand high energy electromagnetic pulse environments such as might be encountered in an electrical storm, from power surges, or possibly from radar or other sources. This paper attempts to fill in this gap by describing experimental techniques and equipment for providing EMP environments in the laboratory at both the low (1-MC) and high frequency (10-MC) portion of the electromagnetic frequency spectrum.