Single photon source characterization with a superconducting single photon detector

descriptionPublicationkeyboard_double_arrow_right Article , Preprint 01 Jan 2005Embargo end date: 01 Jan 2005Publisher:IEEEJournal:2006 Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference

Authors: Hadfield, R.; Stevens, M.J.; Gruber, S.S.; Miller, A.J.; Schwall, R.E.; Mirin, R.P.; Nam, S.W.;

doi: 10.1109/cleo.2006.4628701 , 10.1364/opex.13.010846 , 10.48550/arxiv.quant-ph/0511030

pmid: 19503303

arXiv: quant-ph/0511030

Single photon source characterization with a superconducting single photon detector

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Abstract

Superconducting single photon detectors (SSPD) based on nanopatterned niobium nitride wires offer single photon counting at fast rates, low jitter, and low dark counts, from visible wavelengths well into the infrared. We demonstrate the first use of an SSPD, packaged in a commercial cryocooler, for single photon source characterization. The source is an optically pumped, microcavity-coupled InGaAs quantum dot, emitting single photons on demand at 902 nm. The SSPD replaces the second silicon Avalanche Photodiode (APD) in a Hanbury-Brown Twiss interferometer measurement of the source second-order correlation function, g (2) (tau). The detection efficiency of the superconducting detector system is >2 % (coupling losses included). The SSPD system electronics jitter is 170 ps, versus 550 ps for the APD unit, allowing the source spontaneous emission lifetime to be measured with improved resolution.

8 pages

Related Organizations

National Institute of Standards and Technology
United States
Albion College
United States

Keywords

Quantum Physics, FOS: Physical sciences, Quantum Physics (quant-ph)

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