W-band Silicon dielectric measurement

descriptionPublicationkeyboard_double_arrow_right Article , Conference object 01 Jul 2014 Turkey Publisher:IEEEJournal:2014 IEEE Antennas and Propagation Society International Symposium (APSURSI)

Authors: Seyyedesfahlan, Mirmehdi; Nemati, Mohammad Hossein; Tekin, İbrahim;

doi: 10.1109/aps.2014.6904787

W-band Silicon dielectric measurement

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Abstract

In this paper, a free space based method for measurement of silicon dielectric constant is presented at W band frequencies. The dielectric constant of silicon is calculated using measured phase information of the transmitted signal (S21) through Silicon sheet of 500um thickness. Measured dielectric constant for silicon wafer has numerous fluctuations which come from multiple reflection and diffraction effect due to sharp edges.

Country

Turkey

Related Organizations

Sabancı University
Turkey

Keywords

TK7800-8360 Electronics

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