Energy-storage pulsed-power capacitor technology

descriptionPublicationkeyboard_double_arrow_right Article , Other literature type 01 Jan 1992Publisher:Institute of Electrical and Electronics Engineers (IEEE)Journal:IEEE Transactions on Power Electronics, volume 7, pages 251-257 (issn: 0885-8993, eissn: 1941-0107,

Copyright policy )

Authors: J.R. Laghari; W.J. Sarjeant;

doi: 10.1109/63.124597 , 10.1109/ipss.1990.145870

Energy-storage pulsed-power capacitor technology

- Summary
- Metrics

Abstract

This review addresses fundamentals of dielectric capacitor technology and multifactor stress aging of all classes of insulating media that form elements of this technology. It is directed towards the delineation of failure processes in highly stressed, compact capacitors. Factors affecting the complex aging processes such as thermal, electromechanical, and partial discharges are discussed. Diagnostic measurement techniques available and those being developed to determine material degradation affecting available life and failure probability of capacitors are presented. >

Related Organizations

State University of New York at Potsdam
United States
State University of New York
United States

Impact byBIP!

	selected citations These citations are derived from selected sources. This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).	74
	popularity This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.	Top 1%
	influence This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).	Top 1%
	impulse This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.	Average