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Journal of Physics : Conference Series
Article . 2009 . Peer-reviewed
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Reliable measurement of Seebeck coefficient in semiconductors

Authors: Walter Winkelbauer; Udo Kuhlmann; Helmut Werheit; Bernhard Herstell;

Reliable measurement of Seebeck coefficient in semiconductors

Abstract

Reliable measurement of the Seebeck coefficient requires painstaking precautions. Unfortunately, these requirements are not met even in commercially available equipment, and therefore the obtained data often contain systematic errors. We describe equipment for reliable Seebeck measurements and present results on YB66 and B4.3C boron carbide as an example.

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    15
    popularity
    This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
    Top 10%
    influence
    This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
    Top 10%
    impulse
    This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
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citations
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
15
Top 10%
Top 10%
Average
gold