Secondary electron emission from insulators

A modified LEED/Auger diagnostic allows the measurement of the coefficient of secondary electron emission, δ, under electron bombardment. To measure currents on insulators, the system is pulsed. Problems due to charging are alleviated by alternating between pulses in which the target charges negatively (δ 1). A measurement of δ requires a total primary beam charge of ≈−0.2 nC. Results obtained on alumina and synthetic diamond will be presented.

Related Organizations

Dutch Research Council
Netherlands
Institute for Atomic and Molecular Physics
Netherlands

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