Dielectric characterization of polycrystalline Sr2Bi4Ti5O18

descriptionPublicationkeyboard_double_arrow_right Article 01 Oct 1999 India English Publisher:AIP PublishingJournal:Journal of Applied Physics, volume 86, pages 3,885-3,889 (issn: 0021-8979, eissn: 1089-7550,

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Authors: Srinivas, K; James, AR;

doi: 10.1063/1.371304

Dielectric characterization of polycrystalline Sr2Bi4Ti5O18

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Abstract

Five layered Sr2Bi4Ti5O18 has been prepared in the ceramic form with a view to studying its electrical properties. X-ray and microstructural studies were employed for physical characterization. Detailed electrical property measurements were undertaken so as to understand the basic transport physics of this compound. The results of dielectric studies, dc conductivity, and ac impedance are discussed, and a defect formula for Sr2Bi4Ti5O18 has been proposed. The investigations on this material at high temperatures and frequencies reveal its stable behavior.

Country

India

Related Organizations

Materials Research Center
India
Osmania University
India
Indian Institute of Science Bangalore
India

Keywords

Materials Research Centre

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