High-resolution low-energy diffractometer

J. F. Wendelken; F. M. Propst

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Review of Scientific Instruments

Article . 1976 . Peer-reviewed

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https://dx.doi.org/10.1063/1.1...

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High-resolution low-energy diffractometer

descriptionPublicationkeyboard_double_arrow_right Article 01 Sep 1976 English Publisher:AIP PublishingJournal:Review of Scientific Instruments, volume 47, pages 1,069-1,078 (issn: 0034-6748, eissn: 1089-7623,

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Authors: J. F. Wendelken; F. M. Propst;

doi: 10.1063/1.1134820

High-resolution low-energy diffractometer

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Abstract

A high-resolution low-energy electron diffractometer is described. Motivation for its design features is provided and data obtained in several operating modes using an Al(100) target surface are displayed. These modes of operation include LEED, ILEED, AES, and ELS (electron loss spectroscopy). Angular dependence and temperature dependence may be examined in each of these modes. An interband transition is observed at 1.6 eV and a vibrational energy of 102 meV for oxygen on aluminum is reported. The influence of phonon scattering is displayed via temperature-dependent angular profiles.

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University of Illinois at Urbana Champaign
United States

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