Near‐field (NF) measurements with NF‐to‐far‐field (FF) transformation are a powerful and standard approach to modern antenna measurements. This approach implies a relatively close distance between device under test (DUT) and probe and, since the latter is rarely an ideal probe, it will introduce effects that have to be removed to obtain a FF which is only expression of the DUT. In this study, the authors introduce a probe compensation technique applicable to a generic scan surface with non‐uniform, possibly incomplete sampling. The procedure is based on a hybridisation between simulations and measurements of the DUT, originally devised to achieve a radical undersampling of the NF with respect to the Nyquist criteria, in order to perform fast and accurate measurements. They present results that prove the effectiveness of the proposed approach.