Critical assessment of charge mobility extraction in FETs
Copyright policy ) CHOI, HYUN HO; CHO, KIL WON; PODZOROV, VITALY; FRISBIE, C. DANIEL; SIRRINGHAUS, HENNING;
Critical assessment of charge mobility extraction in FETs
Mobility is an important charge-transport parameter in organic, inorganic and hybrid semiconductors. We outline some of the common pitfalls of mobility extraction from field-effect transistor (FET) measurements and propose practical recommendations to avoid reporting erroneous mobilities in publications.
Korea (Republic of)
- University of Minnesota United States
- University of Minnesota Morris United States
- Pohang University of Science and Technology Korea (Republic of)
- Rutgers, The State University of New Jersey United States
- University of Cambridge United Kingdom
PENTACENE, SURFACE, POLYMER, TRANSPORT-PROPERTIES, HALL, VACUUM, ORGANIC TRANSISTORS, SINGLE-CRYSTALS, FIELD-EFFECT TRANSISTORS
PENTACENE, SURFACE, POLYMER, TRANSPORT-PROPERTIES, HALL, VACUUM, ORGANIC TRANSISTORS, SINGLE-CRYSTALS, FIELD-EFFECT TRANSISTORS
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These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
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This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
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