Neural networks are intended to be used in future nanoelectronic technology since these architectures seem to be robust to malfunctioning elements and noise in its inputs and parameters. In this work, the robustness of radial basis function networks is analyzed in order to operate in noisy and unreliable environment. Furthermore, upper bounds on the mean square error under noise contaminated parameters and inputs are determined if the network parameters are constrained. To achieve robuster neural network architectures fundamental methods are introduced to identify sensitive parameters and neurons.