Selection of measurement frequency in Mott–Schottky analysis of passive layer on nickel

descriptionPublicationkeyboard_double_arrow_right Article 01 Feb 2006 English Publisher:Elsevier BVJournal:Electrochimica Acta, volume 51, pages 2,204-2,208 (issn: 0013-4686,

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Authors: K. Darowicki; S. Krakowiak; P. Ślepski;

doi: 10.1016/j.electacta.2005.04.079

Selection of measurement frequency in Mott–Schottky analysis of passive layer on nickel

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Abstract

Abstract The measurements of charge space capacity versus potential have been carried out on passive nickel electrode. The Mott–Schottky relationship was obtained for different measurement frequencies. The shape of this characteristic depends on selection of the measurement frequency. Due to that fact, the accounted defect concentration depends on frequency also. The Mott–Schottky relationship obtained by means of dynamic electrochemical impedance spectroscopy does not possess this disadvantage.

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Gdańsk University of Technology
Poland

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