Flag-leaf angle (FLAngle), flag-leaf area (FLarea) and flag-leaf area duration (FLADuration) are important traits in determining yield in wheat (Triticum aestivum L). Genetic studies on these traits are very few. The objective of this study was to determine the gene action controlling those traits in four wheat crosses. Six generations were available for each cross: parents (P1 and P2), F1, F2 and backcrosses (BC(F1×P1) and BC(F1×P2)). The joint scaling test described by Mather and Jinks was used to test goodness of fit to eight genetic models. Models including additivity, dominance and interallelic interactions best fitted the data for the three traits and the four crosses. Additive effects were most prevalent for FLAngle. They were also significant for FLArea and FLADuration. Dominance and epistatic gene action were also found, but the degree and direction was both trait- and genotype-specific. Heritabilities values were intermediate. Genetic progress, although slow, can be expected when selecting for these traits; however, selection would be most effective if delayed to later generations because of dominance and epistatic effects.