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image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao annals of telecommun...arrow_drop_down
image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
annals of telecommunications - annales des télécommunications
Article . 1990 . Peer-reviewed
License: Springer TDM
Data sources: Crossref
image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
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Conference object . 1990
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Générateur de machines séquentielles autotestables pour circuits intégrés spécifiques

Authors: Berrou, Claude; Douillard, Catherine;

Générateur de machines séquentielles autotestables pour circuits intégrés spécifiques

Abstract

This paper presents an original method using a ROM memory, of systematically synthesizing on-line and offline self-testing synchronous sequential machines (automata, sequencers,), for the design of compiled ASIC’S. Choices about state transition graph coding and circuit architecture are related to simplicity, compactness, operating rate and especially to testability. The on-line and off-line testing is based on an error detecting code of a recurrent type: in addition to useful data, the ROM memory contains redundant information which is distributed between two consecutive states. This method guarantees both present state coherence and past transition conformity. On-line testing is based in this type of coding, called distributed redundancy coding. Its fault coverage is given for different classes of hardware failures. Off-line testing, which is exhaustive, uses the distributed redundancy coding technique and consists in scanning all the possible graph transitions in memory address order.

Country
France
Keywords

[INFO.INFO-AR] Computer Science [cs]/Hardware Architecture [cs.AR], [SPI.TRON] Engineering Sciences [physics]/Electronics

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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
0
Average
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