Surface photovoltage spectroscopy on semiconductor surfaces

descriptionPublicationkeyboard_double_arrow_right Article 01 Jun 1977 English Publisher:Springer Science and Business Media LLCJournal:Il Nuovo Cimento B Series 11, volume 39, pages 748-758 (eissn: 1826-9877,

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Authors: H. Lüth; G. Heiland;

doi: 10.1007/bf02725820

Surface photovoltage spectroscopy on semiconductor surfaces

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Abstract

Surface photovoltage (SPV) spectroscopy is discussed with respect to its application for the investigation of semiconductor surfaces. Principles of the method and the experimental equipment are presented. As examples for the study of surface states, recent experimental results on ultrahigh-vacuum (UHV) cleaved surfaces of Ge, Si, GaAs and ZnO are briefly reviewed.

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