
doi: 10.1007/bf00037532
Eighteen spring wheat cultivars were tested in microfields and race nurseries for their partial resistance PR to wheat leaf rust under low and high disease pressure respectively. Large differences existed between the 18 cultivars, Skalavatis 56 being the most susceptible and Ponta Grossa 1 being the most resistant cultivar. Of the three epidemic parameters, disease severity (DS) at the time that the susceptible check was severely diseased and area under the transformed disease severity curve (AUTC) and the logistic growth rate (r), AUTC and DS were highly correlated. Both seemed to be reliable estimators of PR but DS should be preferred for economical reasons. The logistic growth rate seemed to be unsuitable as an estimator of partial resistance.
components of resistance, leaf rust, Puccinia recondita f.sp. tritici, wheat, Triticum aestivum, epidemiological parameters, partial resistance, microfield, race nursery
components of resistance, leaf rust, Puccinia recondita f.sp. tritici, wheat, Triticum aestivum, epidemiological parameters, partial resistance, microfield, race nursery
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