A review of small-angle X-ray (SAXS) and small-angle neutron (SANS) scattering instruments is given. The difference between long-slit and pinhole collimation and the influence of a broad band-pass monochromator are discussed with respect to the smearing of the measured scattering curves. The various components of SAXS setups are described: conventional and synchrotron sources, monochromators, slits, focusing devices, and detectors including those with position sensitivity. The most frequently used instruments, which can be constructed by combining these components are discussed along with their characteristics: the Kratky block cameras, the Bonse-Hart system including the ’double’ collimated version and the high-energy version, simple pinhole camera for conventional sources as well as for anomalous scattering using synchrotron radiation, the Huxley-Holmes design with a focusing perfect crystal monochromator and a focusing mirror, and setups using synthetic multilayer monochromators. For SANS instruments the commonly used components are described: Neutron sources, monochromators, slits and guides, and detectors. The typical SANS setups for steady-state reactors are discussed as well as those using the time-of-flight technique for pulsed sources. A Bonse-Hart double crystal diffractometer for performing ultra-small-angle neutron scattering is described. Finally, the appropriate areas of application of the SAXS and the SANS instruments are discussed.