
doi: 10.1007/10783464_7
AES Auger Electron Spectroscopy ARUPS Angle-Resolved UV Photoelectron Spectroscopy ∆Φ work-function change ELS Energy Loss Spectroscopy FEM Field Emission Microscopy HAS He Atom Scattering HREELS High-Resolution Electron Energy Loss Spectroscopy INS Ion Neutralization Spectroscopy IPES Inverse Photoelectron Spectroscopy IRAS IR Reflection Absorption Spectroscopy LEED Low-Energy Electron Diffraction MDS Metastable Deexcitation Spectroscopy min minimum ML monolayer NMR Nuclear Magnetic Resonance NRA Nuclear Reaction Analysis PYS Photoelectron Yield Spectroscopy RBS Rutherford Backscattering Spectroscopy SE Secondary Electron TDS Thermal Desorption Spectroscopy SIMS Secondary Ion Mass Spectroscopy XPS X-ray Photoelectron Spectroscopy
| selected citations These citations are derived from selected sources. This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | 0 | |
| popularity This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network. | Average | |
| influence This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | Average | |
| impulse This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network. | Average |
