AbstractWe have calculated the stopping power of Al, Si, Ni and Cu for swift H and He ion beams. Furthermore, the energy loss straggling corresponding to Ni is also evaluated. The dielectric formalism is used combined with the MELF‐GOS method, which describes the energy loss function of the target by a linear combination of Mermin type energy loss functions for the electron outer‐shell electrons and by generalized oscillator strengths for the electron inner‐shell electrons. We take into account the corrections to the stopping power associated to capture and loss of electrons by the projectile as well as the polarization of the projectile charge density. The versatility of this method is illustrated by the good agreement between their predictions and the experimental results, which is observed for a wide range of projectile energies and targets with different electronic properties. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)