
AbstractThis article introduces a model for high‐power microwave bipolar transistors and its associated parameter‐measuring strategy, whose inclusion of thermal phenomena in the dc characterization allows a good estimate of the device's thermal resistance to be obtained. This type of model provides important capabilities for solid‐state radar transmitter design.
bipolar transistor, Telecomunicaciones, Modeling, CAD
bipolar transistor, Telecomunicaciones, Modeling, CAD
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