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Advanced Materials
Article . 2023 . Peer-reviewed
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Unveiling Charge‐Transport Mechanisms in Electronic Devices Based on Defect‐Engineered MoS 2 Covalent Networks

Authors: Ippolito, Stefano; Urban, Francesca; Zheng, Wenhao; Mazzarisi, Onofrio; Valentini, Cataldo; Kelly, Adam G.; Gali, Sai Manoj; +6 Authors

Unveiling Charge‐Transport Mechanisms in Electronic Devices Based on Defect‐Engineered MoS 2 Covalent Networks

Abstract

Device performance of solution-processed 2D semiconductors in printed electronics has been limited so far by structural defects and high interflake junction resistance. Covalently interconnected networks of transition metal dichalcogenides potentially represent an efficient strategy to overcome both limitations simultaneously. Yet, the charge-transport properties in such systems have not been systematically researched. Here, the charge-transport mechanisms of printed devices based on covalent MoS2 networks are unveiled via multiscale analysis, comparing the effects of aromatic versus aliphatic dithiolated linkers. Temperature-dependent electrical measurements reveal hopping as the dominant transport mechanism: aliphatic systems lead to 3D variable range hopping, unlike the nearest neighbor hopping observed for aromatic linkers. The novel analysis based on percolation theory attributes the superior performance of devices functionalized with π-conjugated molecules to the improved interflake electronic connectivity and formation of additional percolation paths, as further corroborated by density functional calculations. Valuable guidelines for harnessing the charge-transport properties in MoS2 devices based on covalent networks are provided.

Countries
Ireland, Belgium, Italy, France
Keywords

Electronics devices, Physique, chimie, mathématiques & sciences de la terre, Charge transport mechanisms, Covalent network, Defect engineering, Transition metal dichalcogenides, defect engineering, Dichalcogenides, Physical, chemical, mathematical & earth Sciences, Covalent networks, Chimie, General Materials Science, charge-transport properties, Hopping mechanisms, electrical devices, [CHIM.MATE] Chemical Sciences/Material chemistry, Charge-transport properties, aliphatic dithiolated linkers, Mechanical Engineering, transition metal dichalcogenides, Device performance, 600, nanoscale, covalent networks, 540, Hopping mechanism, Chemistry, Mechanics of Materials, Charge transport properties, hopping mechanisms, printed electronics, Electrical devices, Materials Science (all), charge-transport properties; covalent networks; defect engineering; electrical devices; hopping mechanisms; transition metal dichalcogenides

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    popularity
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    Top 10%
    influence
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    This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
41
Top 10%
Top 10%
Top 1%
Green
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