
The detection and assessment of solar cell defects are highly important during the development, production and usage of photovoltaic modules. Solar cell defects can be detected by different methods including electroluminescence, photoluminescence and thermography. In this paper, the algorithm for solar cell defect assessment by infrared image processing is proposed. The algorithm is based on comparison of infrared images of testing cell and the sample of high quality solar cell. For the algorithm realization, the NI LabVIEW and NI Vision Assistant applications are used. The suggested method of defects assessment allows to realize the solar cell infrared image processing automatically with the high definition.
33rd European Photovoltaic Solar Energy Conference and Exhibition; 580-582
Feedstock, Crystallisation, Wafering, Defect Engineering, Silicon Photovoltaics
Feedstock, Crystallisation, Wafering, Defect Engineering, Silicon Photovoltaics
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