4D STEM dataset - DECTRIS ARINA detector - SmB6 sample

4D STEM dataset recorded with DECTRIS ARINA detector. Sample is a monocrystalline domain of SmB6 oriented along the <110> zone axis, prepared with FIB by Elisabeth Mueller at PSI. Data collection was with a probe-corrected 200kV TEM microscope, supported by Mingjian Wu at FAU. Further experimental parameters are listed with the included txt file. Data visualization and processing can be done with NOVENA software, freely available at DECTRIS website. Alternatively, the files can be opened using a HDF5 file reader.

CoM reconstruction published at 10.1088/2515-7639/acf524, Figure 1a

Keywords

electron diffraction, 4DSTEM, ARINA detector

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